Tensile Testing of Thin Films
نویسندگان
چکیده
منابع مشابه
Elastic Properties of Metallic Thin Films: 2d Synchrotron Xrd Analysis during in Situ Tensile Testing
Elastic behavior of thin films studied from in situ loading of the specimen during X-ray diffraction on a synchrotron source is presented. Model nanometric multilayer W/Au systems exhibiting different microstructures were analyzed. These films are supported by a (thin) polyimide substrate. X-ray diffraction in transmission geometry was used to study the deformations of both phases as a function...
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ÐFree standing polycrystalline thin ®lms with a strong h111i texture were tested in uniaxial tension. Studied were electron-beam deposited Ag, Cu and Al ®lms, and Ag/Cu multilayers consisting of alternating Ag and Cu layers of equal thickness, between 1.5 nm and 1.5 mm (bilayer repeat length, l, between 3 nm and 3 mm). The ®lms had a total thickness of about 3 mm. A thin polymeric two-dimension...
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چکیده ندارد.
15 صفحه اولHigh-temperature tensile behavior of freestanding Au thin films
The mechanical behavior of freestanding thin sputter-deposited films of Au is studied at temperatures up to 340°C using tensile testing. Films tested at elevated temperatures exhibit a significant decrease in flow stress and stiffness. Furthermore the flow stress decreases with decreasing film thickness, contravening the usual notion that “smaller is stronger”. This behavior is attributed mainl...
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The exceptional strength and distinct deformation physics exhibited by pure ultrafine-grained and nanocrystalline metals in comparison to their microcrystalline counterparts have been ascribed to the dominant influence of grain boundaries in accommodating plastic flow. Such grain-boundary-mediated mechanisms can be augmented by additional strengthening in nanocrystalline alloys via solute and p...
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ژورنال
عنوان ژورنال: IEEJ Transactions on Sensors and Micromachines
سال: 1999
ISSN: 1341-8939,1347-5525
DOI: 10.1541/ieejsmas.119.73